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Truncation of Fields at Boundaries

Thin Element Approximation (TEA) vs.

Tight Focusing Through a Stratified

Tight Focusing by a High-NA Immersio

Tight Focusing of Variously Polarize

System Analysis with Sequential and

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Tight Focusing by a High-NA Immersion Microscope
Time: 2026-04-20 17:10Source: infocrops.comWriter: infocrops
In an immersion microscope, there is often a coverslip which separates the immersion liquid and the specimen. Therefore, the PSF could be distorted by the interface of the coverslip at the focal plane, which is not very often considered well in the design procedure. In VirtualLab Fusion, the influence of the PSF by the interface of the coverslip can be analyzed straightforwardly. The distortion of the focal spot behind the coverslip is demonstrated and analyzed in a fully vectorial manner.

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