Chromatic aberration plays an important role in the reflection-type fluorescent microcopy, because the emitting wavelength and illumination wavelength are different. On the other hand, such microscopy systems often employ high-NA lenses as objectives. Therefore,the vectorial effect must be also taken into consideration for the performance analysis. In VirtualLab Fusion, chromatic effects of high-NA objective lens can be analyzed in a full vectorial manner. As an example, the performance of a patented objective lens is evaluated.
